Detail of Publication
| Text Language | English |
|---|---|
| Authors | Jun Sun, Yushinobu Hotta, Yutaka Katsuyama, Satoshi Naoi |
| Title | Low resolution character recognition by dual eigenspace and synthetic degraded patterns |
| Book_Title | Proc. 1st ACM workshop on Hardcopy document processing |
| Pages | pp.15-22 |
| Year | 2004 |