Detail of Publication
Text Language | English |
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Authors | Jun Sun, Yushinobu Hotta, Yutaka Katsuyama, Satoshi Naoi |
Title | Low resolution character recognition by dual eigenspace and synthetic degraded patterns |
Book_Title | Proc. 1st ACM workshop on Hardcopy document processing |
Pages | pp.15-22 |
Year | 2004 |