|
|
Detail of Publication
Text Language |
English |
Authors |
Jun Sun, Yushinobu Hotta, Yutaka Katsuyama, Satoshi Naoi |
Title |
Low resolution character recognition by dual eigenspace and synthetic degraded patterns |
Book_Title |
Proc. 1st ACM workshop on Hardcopy document processing |
Pages |
pp.15-22 |
Year |
2004 |
Back to list
|